PIND

A PIND test is a Particle Impact Noise Detection test.

According to method 2020.9 of MIL-STD-883 and method 2052.5 of MIL-STD-750, the purpose of a PIND test is to detect loose particles inside an electronics device cavity. The test provides a nondestructive means of identifying those devices containing particles of sufficient mass that, upon impact within the cavity, excite the transducer.

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References edit

^ "Test Method Standard Microelectronic Circuits MIL-STD-883J w/Change 5" (PDF). Department of Defense. Archived from the original (PDF) on 4 March 2016. Retrieved 17 December 2015.
^ "TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES MIL-STD-750F" (PDF). Department of Defense. Archived from the original (PDF) on 2015-12-22. Retrieved 2015-12-17.

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[1] "Test Method Standard Microelectronic Circuits MIL-STD-883J w/Change 5" (PDF). Department of Defense. Archived from the original (PDF) on 4 March 2016. Retrieved 17 December 2015.

[2] "TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES MIL-STD-750F" (PDF). Department of Defense. Archived from the original (PDF) on 2015-12-22. Retrieved 2015-12-17.

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