English: For the arc-shaped slit in an EUV lithography system, the same illumination is rotated across slit.[1][2][3][4][5][6][7] Consequently, it will be necessary to counter-rotate the illumination pupil source at different slit locations (at different times) to compensate, as indicated by the different colors above. Otherwise, light from allowed illumination angles will be rotated to become forbidden angles, and the pattern orientation must change across slit,[8] to avoid the forbidden illumination angles (see first figure below). In the latter case, a rectangular layout after rotation would occupy a substantially larger area,[8][9] with the area difference unable to be used or else forced to be filled.
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↑D. Hellweg et al., Proc. SPIE 7969, 79690H (2011).
↑R. Capelli et al., Proc. SPIE 10957, 109570X (2019).