Silicon_dislocation_orientation_111_mag_500x_2.png (768 × 576 pixels, file size: 574 KB, MIME type: image/png)
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Date/Time | Thumbnail | Dimensions | User | Comment | |
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current | 00:17, 13 September 2005 | 768 × 576 (574 KB) | Twisp | * Title: Dislocation in Si crystal, orientation 111 * Desc: Image of dislocation in Si crystal made using interference microscope with 500x magnification. Crystal orientation can be determined by the triangular (pyramidal) shape of the dislocation. * Auth |
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