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File:ZEISS Crossbeam 550- Your FIB-SEM for High Throughput 3D Analysis and Sample Preparation (33411552526).jpg

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Description
English: With ZEISS Crossbeam you benefit from a 3D nano-workstation: combine imaging and analytical performance of a field emission scanning electron microscope (FE-SEM) with the processing ability of a focused ion beam (FIB). For milling, imaging or when performing 3D analytics.
हिन्दी: इस फ़ाइल में अतिरिक्त जानकारी शामिल है जैसे कि Exif मेटाडेटा जो डिजिटल कैमरा, स्कैनर, या सॉफ्टवेयर प्रोग्राम द्वारा इसे बनाने या डिजिटाइज़ करने के लिए उपयोग किया गया हो सकता है। यदि फ़ाइल को उसकी मूल स्थिति से संशोधित किया गया है, तो टाइमस्टैम्प जैसे कुछ विवरण पूरी तरह से मूल फ़ाइल को प्रतिबिंबित नहीं कर सकते हैं। टाइमस्टैम्प केवल कैमरे में घड़ी के रूप में सटीक है, और यह पूरी तरह से गलत हो सकता है।
Date
Source ZEISS Crossbeam 550: Your FIB-SEM for High Throughput 3D Analysis and Sample Preparation
Author ZEISS Microscopy from Germany

Images donated as part of a GLAM collaboration with Carl Zeiss Microscopy - please contact Andy Mabbett for details.

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This image was originally posted to Flickr by ZEISS Microscopy at https://flickr.com/photos/75834543@N06/33411552526. It was reviewed on 15 April 2017 by FlickreviewR and was confirmed to be licensed under the terms of the cc-by-2.0.

15 April 2017

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current22:54, 15 April 2017Thumbnail for version as of 22:54, 15 April 20175,717 × 4,940 (1.65 MB)PigsonthewingTransferred from Flickr via Flickr2Commons
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