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AFMimageRoughGlass20x20.png (401 × 326 pixels, file size: 187 KB, MIME type: image/png)
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| Description |
Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm). The AFM used was the Veeco di CP-II, scanned in contact mode. Constructed at the Nanorobotics Laboratory at Carnegie Mellon University (http://nanolab.me.cmu.edu). |
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| Source | http://en.wikipedia.org/w/index.php?title=File:AFMimageRoughGlass20x20.png&oldid=78162444 | ||
| Author | Chych | ||
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 17:43, 19 February 2009 | | 401 × 326 (187 KB) | Linforest | {{Information |Description=Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm). The AFM |
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